Webb Laura Ockel Qox9ksvpqcm Unsplash

Nano-focused X-rays aid integrated circuit development

A modern chip contains billions of transistors. The size of individual features is just a couple of tens of nanometres. With decreasing size follows increased demands on material control and characterisation down to the atomic scale. The nano-focused X-ray beam at beamline NanoMAX prove to be a useful tool for investigating electromigration, a significant cause of failure in on-chip interconnects.

Highlights

Drone image of MAX IV from above, surrounded by green landscape and the horizon.

A record year for research at MAX IV

MAX IV is making significant societal contributions in terms of record-high scientific productivity. In 2023, the number of publications increased by 51% compared to the previous year, and the number of unique users increased by 31%. Moreover, the number of proposals submitted in the most recent Open Call was higher than ever.

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Conceptual design for three potential new beamlines developed with WISE

After successfully bringing the first 16 funded beamlines into operation, we now look into the future. In collaboration with the Wallenberg Initiative Materials Science for Sustainability (WISE), funded by the Knut and Alice Wallenberg Foundation and together with the scientific community, MAX IV will develop the conceptual designs for three potential new materials science beamlines.