How to apply
…the facilities before they apply. User policies Academic users can access all aspects of the facility free of charge. All experiments at FragMAX are governed by MAX IV user policies….
…the facilities before they apply. User policies Academic users can access all aspects of the facility free of charge. All experiments at FragMAX are governed by MAX IV user policies….
…a user have to perform in DUO. If you have questions or notice that something is missing in the guides, please feel free to contact the MAX IV User Office….
…with lunch on the 5 December and finish with Lunch on the 6 December with get together and dinner on the 5 December. The participation is free but limited to…
…as a detector of electrons and equipped with a 2D Delayline Detector. An Ar or N2 glove box can be attached to the endstation for moisture and oxygen-free sample transfer….
…Sc-containing complex oxides at FinEstBeAMS” – Dmitry Spasskiy, University of Tartu (EE) 10:50 “A new sample delivery system for x-ray photoelectron spectroscopy studies of in-flight aerosol and free nanoparticles” –…
…freedom for alignment, and explicitly address this point in your proposal. The spin-resolved ARPES endstation has demonstrated baseline functionality and formally left commissioning, but is still very new. You are…
…brings up a detailed description of the note including the author and abstract, as well as a download link. Content may be viewed and downloaded freely. When referring to content…
…to adapt the sealing process for different packaging materials and food types. Interested in doing industrial research at MAX IV but don’t know how? Feel free to contact our Industrial Relations…
…to freely choose the energy of XRD acquisition (within a window of ~3keV from the XAS energy range. The overall achieved time resolution for combined measurements is dominated by XAS…
…research extends from the electronic structure studies of free particles (atoms, molecules, clusters and atmospheric particles) in gas phase and on surfaces to formation analysis and nanoscale characterisation of surfaces…