A record year for research at MAX IV
…proposals from national and international researchers who applied to use MAX IV this autumn. The total number of proposals submitted in the 2023 Open Calls (717) was 14% higher than…
…proposals from national and international researchers who applied to use MAX IV this autumn. The total number of proposals submitted in the 2023 Open Calls (717) was 14% higher than…
…for everyone curious about MAX IV. The next Open Day at MAX IV will be September 21, 2024 from 9:00 to 16:00. Tickets for Open Day are free of charge…
…Chiu was elected Fellow of The Electrochemical Society (ECS), the American Society of Mechanical Engineers (ASME), and the American Society of Thermal and Fluids Engineers (ASTFE). He is an elected…
…within such ribbons without the application of an electromagnetic field. “Normally, when we have a quantum conducting channel, we can turn it into a spin-ballistic channel by applying a magnetic…
…Sputter gun Yes (IS 40C1 from Prevac) Heating Mo-based manipulator head, on-sample K-type thermocouple sensor Radiative heating by filament (up to 800 °C) Electron beam heating (up to 1200 °C)…
…the beamline staff. Electrical connections: The equipment can be connected using a 25-pin SUB-D connector if electrical signals are required. Size: The footprint (radius) of the device should ideally be…
Overview The beamline is sourced by a quasi-periodic elliptically polarizing undulator (qEPU). A toroidal mirror M1 collects the diverging beam from the undulator and collimates it vertically (in the dispersive…
…been performed by the MAX IV scientific staff. Evaluation: The feasible projects have then been in a second step evaluated by an external panel. Selection: In a final step, the…
The research infrastructure EU project ReMade@ARI aims to be the central hub for all sectors and research areas in which new materials for a circular economy will be developed. The…
…in 2024. Methods X-ray fluorescence (XFM) mapping Using the nano-focused beam, information about the local elemental composition of the illuminated area can be extracted by measuring the secondary X-ray fluorescence…