Nano-focused X-rays aid integrated circuit development

…difference in thermal expansion between the silicon substrate and the copper line structure, but later the stresses developing during electromigration become dominant. A better understanding of the stress within the…

Resolution of the AC-SPELEEM

Energy resolution The energy resolution in the various acquisition modes is: better than 0.2 eV in XPEEM; 0.15 eV in μ-XPS and 0.15 eV in μ-ARPES. Spatial resolution The spatial…

User information AFM

…max 90×90 micrometers with max 5 micrometer total height difference. The lateral resolution for 90 micrometer FOV is better than 50 nm, for 10 micrometer scan – better than 2…

Data handling and processing at BioMAX

…data reduction chevron_right XDS XDSAPP3: Open the GUI: Applications → PreSTO → XDSAPP3. (the old XDSAPP does not work for data collected after February 2022) Allocate the number of cores…

Experimental station

…Second, synchronisation with the storage ring allows ignoring detector counts that occurs between the X-ray pulses, lowering the MCP dark noise by >80%. Third, it allows synchronisation with external equipment…

Surface & Material Science branch

…at sample Defocused (FWHM, h x v): up to 1 x 0.4 mm Focused (FWHM, h x v): 50 x 0.75*[exit_slit_opening] μm; further reduction in size is possible with baffles…

Programme & Partners

…brilliant synchrotron MAX IV. Through PRISMAS, Swedish universities, institutes, leading industrial partners, and MAX IV have come together to make Sweden take the lead in educating the next generation of…