Experimental station
…of the illumination. At 300 eV, the smallest spot size is about 30 nm, between 700 eV and 1600 eV, the smallest spot size is about 22 nm, and above…
…of the illumination. At 300 eV, the smallest spot size is about 30 nm, between 700 eV and 1600 eV, the smallest spot size is about 22 nm, and above…
…is the user name you use to log in to DUO or the beamline computers. Enter your password and next you will be prompted for the “otp” code. Go to…
…is to: Train future researchers and scientists to better tackle major future societal challenges using synchrotron research. Increase the knowledge and promote the use of advanced synchrotron research methods in…
…of a tennis ball (smaller is better); maximum of 2 kg (much lighter is much better); safe to use; no thick stiff cables/hoses/tubes that would exert force on the piezo…
…difference in thermal expansion between the silicon substrate and the copper line structure, but later the stresses developing during electromigration become dominant. A better understanding of the stress within the…
…advanced tool alloys. How can industrial tools perform better and last longer? A crucial step is to make the tool’s metal surface more resistant to corrosion. Together with a team…
Energy resolution The energy resolution in the various acquisition modes is: better than 0.2 eV in XPEEM; 0.15 eV in μ-XPS and 0.15 eV in μ-ARPES. Spatial resolution The spatial…
…max 90×90 micrometers with max 5 micrometer total height difference. The lateral resolution for 90 micrometer FOV is better than 50 nm, for 10 micrometer scan – better than 2…
…know how to modify proteins; we understand better and better how they react with other proteins and molecules. They are natural and – by definition – what life itself takes…
…rapid feedback on data quality, while autoPROC and DIALS runs significantly slower; autoPROC performs anisotropy analysis which results in better data in some cases. The output files of the automated…