Beamline optics
X-ray source (EPU) Elliptically polarising undulator (APPLE-II type), 48 mm period, 1st harmonic 173-1650 eV Energy range 275 – 2500 eV, using 1st and 3rd harmonic of the EPU Vertically…
X-ray source (EPU) Elliptically polarising undulator (APPLE-II type), 48 mm period, 1st harmonic 173-1650 eV Energy range 275 – 2500 eV, using 1st and 3rd harmonic of the EPU Vertically…
…stability, and chemical versatility, offering the next level of material exploration for future applications. We sat down with Craig Polley, Bloch beamline manager, to talk about this research surprise and…
…pore size distribution in nano filters for high-performance applications.Being the anti-particle of electrons, positrons are used to probe material defects at low concentrations and with high sensitivity. With the advantage…
…different range of length scales, as schematically illustrated in the figure. The standard approach is parallel-plate geometry, with PLI monitoring the velocity-velocity gradient plane, but concentric-cylinder geometry is also possible….
…neuromorphic applications by mimicking the biological brain.” Publication Mamidala Saketh Ram et al High-density logic-in-memory devices using vertical indium arsenide nanowires on silicon open_in_new Nature Electronics, 2021 DOI: 10.1038/s41928-021-00688-5 open_in_new…
…main techniques applied, explains MAXPEEM beamline manager Alexei Zakharov, were micro-X-ray Absorption Spectroscopy (micro-XAS) with spatial resolution below 50 nanometres and high energy resolution micro-XPS. “The beamline personnel were extremely…
…and/or other instruments at MAX IV. The free seminars are open to all. Webinar 1: ForMAX beamline – What is it and how to apply? September 14, 13.00 – 15.00…
…contributes to the oxide film. The use of synchrotron X-rays for studying surfaces and thin films of applied materials has robust, beneficial aspects. “The main benefits of synchrotron radiation are…
…Du LM, Bäcke O, Kalbfleisch S, Zhang GQ, Vollebregt S, Colliander MH Measuring residual stresses in individual on-chip interconnects using synchrotron nanodiffraction Appl. Phys. Lett. 124, 083501 (2024) https://doi.org/10.1063/5.0192672 open_in_new…
…there to support us… We will definitely be applying for more beam time and hope to be back soon.” Are you also interested in doing industrial research at MAX IV?…