Atomic Force Microscope

AFM at X-ray Optics Lab It is possible now for MAX IV users to characterize their samples with true Atomic Force Microscopy, using the Dimension 3100 machine from Veeco/Digital Instruments….

Sample holders

…OMNY pin sample holders for the NanoMAX Imaging Station. Left: sample pins compatible usable at the NanoMAX imaging station. Sample preparation and mounting is essential for a successful beamtime. Discuss…

BAG Access

…monochromator and CRL focusing (beam size down to 5 micrometer). NOTE: Automated rotational crystallography is still in commissioning and the experiment control in development. This functionality is planned to be…

Technical Notes

R3 beam dynamics High-Chromaticity_Optics_for_the_MAX_IV_3_GeV_Storage_Ring.pdf Internal_Note_20090902_Updated_Lattice_120614.pdf Internal_Note_20100318_Updated_Lattice_120614.pdf Internal_Note_20100512_Pulsed_Magnet_Injection_120612.pdf Internal_Note_20101101_Updated_Lattice_120614.pdf Internal_Note_20101203_Magnet_Synchronization_120612.pdf Internal_Note_20110117_Updated_Lattice_120612.pdf Internal_Note_20111124_Updated_Lattice_120611.pdf Internal_Note_20121107_Updated_Lattice_140129.pdf Internal_Note_20130724_OCO_Modeling_141009.pdf Internal_Note_20150129_MIK_Analysis_150130.pdf Internal_Note_20150930_MW_Threshold.pdf insertion devices Internal_Note_20090922_Insertion_Devices_for_the_MAX_IV_3_GeV_Storage_Ring.pdf Internal_Note_20100215_Insertion_Devices_for_the_MAX_IV_3_GeV_Ring.pdf Internal_Note_20101209_Elliptically_Polarising_Undulators_with_11_mm_Magnetic_Gap_at_the_MAX_IV_3_GeV_Ring.pdf Internal_Note_20111110_Comparison_Brilliance_MAX_IV_NSLS-II.pdf Internal_Note_20111220_Elliptically_polarizing_undulators_for_the_Arpes_beamline_at_the_Solaris_Light_Source.pdf RF cavities Internal_Note_20240410 Harmonic Cavity Parameters for Flat…

Staff

…+46462226631 Johan Selberg Office location: E120049 E-mail: Johan.Selberg@maxiv.lu.se Phone: +46462226645 Niklas Johansson Office location: D110070 E-mail: Niklas.Johansson@maxiv.lu.se Phone: +46462224575 Nils Pistora Mechanical designer Office location: D110050-6 E-mail: nils.pistora@maxiv.lu.se Phone: +46462221641…

High-Temperature Cell

…time-resolved APXPS using please the HT cell, please, check Time-resolved APXPS page. Purpose To enable photoemission measurements at mbar pressures and up to 1000 C Description Small volume (1 L)…

A record year for research at MAX IV

…funded beamlines were in operation and open for proposals after years of intense development work.  Much of the published research makes up important puzzle pieces that contribute to a better,…

Experimental station

…PXRD2D, and the imaging instrument in the user program. The second powder diffraction instrument, HERDi, is scheduled for installation in early 2025. On this page and subpages, you can find…

Microscope

…Resolution in STM and ncAFM STM Si(111)-(7×7) tunneling conditions Vbias = +1.55 V, It = 130 pA Left panel: topography map Z(X,Y). Right panel: height profile along the white line….