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Sample mounting (SOPHIE) In 2024, SoftiMAX will host the SOPHIE end-station from the Swiss Light Source, which also features STXM and ptychography. It will be available for general users, instead…
Sample mounting (SOPHIE) In 2024, SoftiMAX will host the SOPHIE end-station from the Swiss Light Source, which also features STXM and ptychography. It will be available for general users, instead…
…infrastructure investments. The next call will open in 2024 and will only be open for beamline proposals. Additional Documents To meet the increased demand from our growing industrial user base…
A step for spintronics A technology known as spintronics is already used to some extent in devices like computer memory and sensors. The number of devices and applications based on…
The article was featured on the cover of Macromolecules journal. Microgels consist of polymers that are crosslinked and forms a ball somewhat resembling a tiny ball of yarn. The connections…
The Swedish Research Council (Vetenskapsrådet, VR), which funds most of MAX IV operations, performed their first operation review on 7–8 May 2024. The six previous reviews by the council since…
Electromigration and failure Copper is the most commonly used material for connecting transistors on a chip. The current being pushed through the tiny copper wires cause a phenomenon called electromigration….
…to the many opportunities this enables for us and the Swedish research community. The new ordinance will be effective from March 12, 2024. Read the full press release on MAX…
…in 2024. Methods X-ray fluorescence (XFM) mapping Using the nano-focused beam, information about the local elemental composition of the illuminated area can be extracted by measuring the secondary X-ray fluorescence…
“Our finding of a common s± (Γ–M) pairing symmetry indicates that the system with both the electron and hole pockets and the system with only hole pockets may share a…
Balder beamline performance (updated 2024-02-05) Technique Primary: XAS (XANES/EXAFS), XES Secondary: XRD, XRF Beam size Focused H 50 x V 50 µm2 (Si111), (Si311) Slits close to sample to reach…