Metrology

MAX IV houses a small optics metrology facility with three specialised instruments that can measure the real, 3D surface of an x-ray optic. The slope, radius, micro-roughness and surface structures can be found with a combination of white light interferometry, Fizeau interferometry and Atomic Force Microscopy. The use of the instruments is not limited to x-ray optics; experiment samples, machined parts and much more have also been characterised.