Dimension Icon IR
It is possible now for MAX IV users to characterize their samples with true Atomic Force Microscopy, using the Dimension Icon IR atomic force microscope from Bruker. This AFM is a part of the Infrared Microscopy Platform (IMP) at MAX IV, but it’s usage is not limited to only infrared spectromicroscopy. A plentyful of other force microscopy modes are accessible for sample characterization, including quantitative nanomechanical mapping (QNM) allowing for mapping such sample properties as adhesion, dissipation, elasticity/stiffness, etc. More information about this microscope and the operation modes is available at Dimension IconIR pages under Infrared Microscopy Platform tab.