| X-ray source (EPU) | Elliptically polarising undulator (APPLE-II type), 48 mm period, 1st harmonic 173-1650 eV |
| Energy range | 275 – 2500 eV, using 1st and 3rd harmonic of the EPU |
| Vertically collimating mirror (M1) | At 24 m, 1° incidence angle, Au & Rh-coated, cylindrical, water-cooled |
| Monochromator (c-PGM) | At 26 m, plane grating monochromator, 1200 l/mm, blaze 1°, Au & Rh coating (300 l/mm, blaze 0.6°, TBI) |
| Energy resolution | ≥ 5000 E/ΔE, and ≥ 10 000 for E<1000 eV (1200 l/mm) |
| First focusing mirror (M3) | CXI: 28.8 m, 1° incidence angle, toroidal, Au-coated STXM: 30.5 m, 1° incidence angle, toroidal double mirror, Rh & Au-coated |
| Secondary source (ES) | At 40.8 m – CXI At 38.5 m – STXM |
| Refocusing optics | CXI: Kirkpatrick-Baez (KB) super-polished plane elliptical mirror pair, inc. angle 1°, Au-coated, at 46.1 & 46.5 m (M4, M5) STXM: Fresnel zone plate (ZP), normal incidence, various sizes |
| Beam size at sample | At 48.7 m – CXI: 20 x 20 µm^2 (FWHM, horizontal x vertical) At 43.5 m – STXM: 10 – 100 nm diameter depending on ZP used |
| Flux at sample (focused spot) | CXI: from 8 x 1012 – 1 x 1012 up to 2200 eV, in 20 µm2 spot STXM: between 1 x 109 (2500 eV) – 1 x 1012 (275) ph/s (in 25 nm spot) |
| Experiment: techniques and set-up | CXI: holography & resonant soft x-ray (magnetic) scattering set up with 2D detector or diode on in-plane goniometer in vacuum chamber STXM: scanning transmission x-ray microscope, with fluorescence detector and 2D detector for ptychography, fast scanning |
